Atom-Probe Field Ion Microscopy
Tien T. (Pennsylvania State University) Tsong
Cambridge University Press, 2005
87,25 €On orderDelivery: 2-3 weeks
Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.
- ISBN-13
- 9780521019934
- ISBN-10
- 0521019931
- Publisher
- Cambridge University Press
- Year
- 2005
- Publication date
- 2005-09-15
- Pages
- 400
- Dimensions
- 234x157x22
- Weight
- 556