Semiconductor Material and Device Characterization
Dieter K. (Arizona State University) Schroder
John Wiley & Sons Inc, 2006
256,50 €On orderDelivery: 2-3 weeks
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.
- ISBN-13
- 9780471739067
- ISBN-10
- 0471739065
- Publisher
- John Wiley & Sons Inc
- Year
- 2006
- Publication date
- 2006-02-17
- Pages
- 800
- Dimensions
- 164x243x51
- Weight
- 1324