Reliability Wearout Mechanisms in Advanced CMOS Technologies
Alvin W. (IBM) Strong, Ernest Y. (IBM) Wu, Giuseppe (IBM) La Rosa, Jordi (Universitat Autonoma de Barcelona, Spain) Sune, Rolf-Peter (Infineon) Vollertsen, Stewart E., III Rauch, Timothy D. (IBM) Sullivan
John Wiley & Sons Inc, 2009
232,50 €On orderDelivery: 2-3 weeks
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
- ISBN-13
- 9780471731726
- ISBN-10
- 0471731722
- Publisher
- John Wiley & Sons Inc
- Year
- 2009
- Publication date
- 2009-09-04
- Pages
- 640
- Dimensions
- 243x164x34
- Weight
- 993