Scanning Probe Microscopy and Spectroscopy
John Wiley & Sons Inc, 2001
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Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science.
- ISBN-13
- 9780471248248
- ISBN-10
- 047124824X
- Publisher
- John Wiley & Sons Inc
- Year
- 2001
- Publication date
- 2001-01-03
- Pages
- 512
- Dimensions
- 163x244x34
- Weight
- 884