Scanning Probe Microscopy and Spectroscopy

John Wiley & Sons Inc, 2001

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Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science.

ISBN-13
9780471248248
ISBN-10
047124824X
Publisher
John Wiley & Sons Inc
Year
2001
Publication date
2001-01-03
Pages
512
Dimensions
163x244x34
Weight
884