Principles and Applications of Ion Scattering Spectrometry
J. Wayne (University of Houston) Rabalais
John Wiley & Sons Inc, 2002
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Ion scattering spectrometry, a powerful analytical tool used to determine the structure and composition of a substance, addresses critical problems in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces (including the large battery industry).
- ISBN-13
- 9780471202776
- ISBN-10
- 0471202770
- Publisher
- John Wiley & Sons Inc
- Year
- 2002
- Publication date
- 2002-10-29
- Pages
- 336
- Dimensions
- 243x159x20
- Weight
- 599