Cluster Secondary Ion Mass Spectrometry
Christine M. Mahoney
John Wiley & Sons Inc, 2013
151,95 €On orderDelivery: 2-3 weeks
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.
- ISBN-13
- 9780470886052
- ISBN-10
- 0470886056
- Publisher
- John Wiley & Sons Inc
- Year
- 2013
- Publication date
- 2013-06-28
- Pages
- 368
- Dimensions
- 165x243x21
- Weight
- 762