ESD
Steven H. (IEEE Fellow, Vermont, USA) Voldman
John Wiley & Sons Inc, 2009
161,75 €On orderDelivery: 2-3 weeks
Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects.
- ISBN-13
- 9780470511374
- ISBN-10
- 0470511370
- Publisher
- John Wiley & Sons Inc
- Year
- 2009
- Publication date
- 2009-07-17
- Pages
- 408
- Dimensions
- 176x253x29
- Weight
- 820