Microstructural Characterization of Materials
David (Technion - Israel Institute of Technology) Brandon, Wayne D. (Technion - Israel Institute of Technology) Kaplan
John Wiley & Sons Inc, 2008
79,95 €On orderDelivery: 2-3 weeks
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle.
- ISBN-13
- 9780470027851
- ISBN-10
- 0470027851
- Publisher
- John Wiley & Sons Inc
- Year
- 2008
- Publication date
- 2008-03-14
- Pages
- 560
- Dimensions
- 245x169x30
- Weight
- 914