Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation
Taylor & Francis Ltd, 2003
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Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the
- ISBN-13
- 9780415303972
- ISBN-10
- 0415303974
- Publisher
- Taylor & Francis Ltd
- Year
- 2003
- Publication date
- 2003-02-06
- Pages
- 366
- Dimensions
- 229x152x
- Weight
- 885