Nanometer Technology Designs
Nisar Ahmed
Springer-Verlag New York Inc., 2007
121,95 €On orderDelivery: 2-3 weeks
Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.
- ISBN-13
- 9780387764863
- ISBN-10
- 0387764860
- Publisher
- Springer-Verlag New York Inc.
- Year
- 2007
- Publication date
- 2007-12-20
- Pages
- 281
- Dimensions
- 242x164x22
- Weight
- 626