Digital Noise Monitoring of Defect Origin
Telman Aliev
Springer-Verlag New York Inc., 2007
121,95 €On orderDelivery: 2-3 weeks
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others.
- ISBN-13
- 9780387717531
- ISBN-10
- 0387717536
- Publisher
- Springer-Verlag New York Inc.
- Year
- 2007
- Publication date
- 2007-07-25
- Pages
- 224
- Dimensions
- 235x155x