High Resolution X-Ray Diffractometry And Topography
Brian K. Tanner, D.K. Bowen
Taylor & Francis Ltd, 2019
113,25 €On orderDelivery: 2-3 weeks
- ISBN-13
- 9780367400637
- ISBN-10
- 0367400634
- Publisher
- Taylor & Francis Ltd
- Year
- 2019
- Publication date
- 2019-10-10
- Pages
- 264
- Dimensions
- 246x174x
- Weight
- 490