Scanning Electron Microscopy and X-Ray Microanalysis
Charles E. Lyman, Dale E. Newbury, David C. Joy, Eric Lifshin, Goldstein, Joseph, J.R. Michael, Linda Sawyer, Patrick Echlin
Springer Science+Business Media, 2003
133,25 €On orderDelivery: 2-3 weeks
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
- ISBN-13
- 9780306472923
- ISBN-10
- 0306472929
- Publisher
- Springer Science+Business Media
- Year
- 2003
- Publication date
- 2003-01-31
- Pages
- 689
- Dimensions
- 255x178x38
- Weight
- 1684