Atom Probe Field Ion Microscopy

A. (Department of Materials, Department of Materials, University of Oxford) Cerezo, G. D. W. (Professor Of Materials Science, Department of Materials, Professor Of Materials Science, Department of Materials, University of Oxford) Smith FRS, M. G. Hetherington, M. K. (Metals and Ceramics Division, Metals and Ceramics Division, Oak Ridge National Laboratory, USA) Miller

Oxford University Press, 1996

A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.

ISBN-13

9780198513872

ISBN-10

0198513879

Publisher

Oxford University Press

Year

1996

Publication date

1996-09-19

Pages

520

Dimensions

242x164x33

Weight

1042